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Ihre Aktion |
suchen [und] sys phy 940.012
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1. |
Polymer Microscopy / Sawyer, Linda C.. - Third Edition. Online-Ausg.. - New York, NY : Springer New York, 2008
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The 21st Nordic Semiconductor Meeting, 18 - 19 August 2005, Sundvolden, Norway / Finstad, Terje G.. - Bristol : IOP, 2006
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3. |
Microscopy of semiconducting materials : proceedings of the 14th conference, April 11 - 14, 2005, Oxford, UK / Cullis, Anthony G.. - Online-Ausg.. - Berlin : Springer, 2005
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Proceedings : Warsaw, Poland, 15 - 19 September 2003 / Godlewski, Marek. - Weinheim [u.a.] : Wiley-VCH, 2004
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20th Nordic Semiconductor Meeting : Tampere University of Technology, Tampere, Finland, August 25 - 27, 2003 / Pessa, Markus. - [Stockholm] : Royal Swedish Acad. of Sciences, 2004
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Semiconductor nanometer devices : fundamentals - concepts - realisations / Amann, Markus C.. - Weinheim : Wiley-VCH-Verl., 2004
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Proceedings : Niagara Falls, New York, USA, 22 - 26 September 2003 / Muñoz, Martin. - Weinheim : Wiley-VCH, 2004
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8. |
Proceedings : Warsaw, Poland, 24 - 27 July 2002 / Godlewski, Marek. - Weinheim : Wiley-VCH, 2003
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9. |
Proceedings of the 19th Nordic Semiconductor Meeting : Lyngby, Denmark, May 20-23, 2001 / Birkedal, D.. - Stockholm : Royal Swedish Academy of Sciences, 2002
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10. |
Amorphous and Microcrystalline Semiconductors - Science and Technology : proceedings of the Seventeenth International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology ; Budapest, Hungary, August 25 - 29, 1997 / Kugler, Sándor. - Amsterdam [u.a.] : North Holland, 1998
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1 - 10 von 36 |
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